Scattering techniques: basic principles & general aspects, primary scattering and interference, comparison X-rays and neutrons, radiation sources and detectors; X-ray diffraction (WAXS): typical setups, diffraction by crystals, Braggs law and Laue condition, Miller indices, Structure factor and lattice factor, scattering of amorphous materials and liquids; small-angle X-ray scattering (SAXS): typical setups, application to semi-crystalline and self-assembled polymers, Guinier law and application to disordered systems; Imaging techniques: light microscopy, atomic force microscopy, electron microscopy techniques
